Full-scale ZEISS O-INSPECT duo in a quality laboratory
ZEISS has combined the functions of a microscope and measuring system in one device with its latest launch, the O-INSPECT duo. The solution can be used to measure and inspect large workpieces/parts in their entirety. By utilising both 3D measurement technology and microscopic inspection, ZEISS aims to enhance efficiency and minimise the amount of space taken up in quality laboratories.
The VMM microscope can perform precise measurements and high-resolution inspections of small and large components, making it an essential element in quality assurance. The optical solutions specialist designed the O-INSPECT duo to handle applications where dimensional measurement and inspection are required (e.g., segmentation and coloured image processing).
Key specs of the ZEISS O-INSPECT duo:
- Available in sizes 8/6/3.
- 55mm working distance.
- 12x mechanical zoom.
- 100kg capacity.
- Camera: ZEISS Discovery.V12 scout 160 c, 5 MP colour camera, 2646 x 2056 pixels.
- Accuracy tactile and optical: 1D: 1,5 μm + L/250, 2D: 1,8 μm + L/250 μm, 3D: 2,2 μm + L/250 μm.
- Software: ZEISS CALYPSO (for metrology), and ZEISS ZEN core (for microscopy).
Metrology benefits of the ZEISS O-INSPECT duo:
The new machine can capture many measuring points in a singular movement. If the system is required to measure small or sensitive parts, it can do so through non-contact measurements with enhanced accuracy with the addition of ZEISS VAST probing (ZVP).
Not only can the O-INSPECT duo conduct dimensional measurements, but also surface inspection. Equipped with a 12x lens colour camera sensor, inspection tasks can be completed. The addition of ZEISS ZEN core software makes microscopy tasks possible.
Microscopy benefits of the ZEISS O-INSPECT duo:
The O-INSPECT duo features ZEISS’ largest microscope which can inspect large workpieces like PCBs, fuel cells, and batteries without cutting them up. This can save the user a substantial amount of time, reduce wasted resources, and also minimise the possibility of errors occurring as the part does not need to be moved between different machines.
Additionally, the automated inspection of multiple smaller parts can also be conducted by the O-INSPECT duo. Instead of having to complete multiple inspections of each sample, the user can simply load the microscope one time with all of the small samples.
With the addition of the colour camera, the system can locate even the smallest of defects through precise inspection and evaluation. This will ensure the quality assurance of each inspected part, and improve accuracy levels.