STAr Sagittarius Series
Sagittarius is an intelligent integrated software.
Since its inception in 2001, the STAr Sagittarius Series has been continuously developed to meet industry needs regarding electronics applications. The intelligent testing software is designed for semiconductor parametric and reliability testing that allows for capacitance-voltage (CV) and current-voltage (IV) measurements to be taken using one platform. Over the years, more than 3000 copies have been deployed in foundries, design houses, and IDMs.
The Series is a Windows-based semiconductor parametric test and device characterisation test software, each solution can be integrated into most benchtop instruments and probe stations. According to the developers, the software provides a comprehensive tool which can speed up the measurement process. Users can configure test systems with unlimited complex matrix or multiplexer and test resources like SMU, and CMU with only a few clicks.
Products included in the STAr Sagittarius Series:
- Sagittarius-TMS Intelligent Test & Measurement System.
- Sagittarius-RMS RF Measurement System.
- Sagittarius-ICT Interactive Curve Tracer.
- Sagittarius-SPT Silicon Photonics Test System.
- Sagittarius-WLR Wafer Level Reliability Test System.
- Sagittarius-MTM Multi-Test Mode System
- Sagittarius-AMT Advanced Memory Tester.
The Series can provide accurate and reliable measurements for GaN, SiC, MOS, RFICs, RF MOSFET, Silicon Photonics Devices, Si/GaAs ICs, FPD and CMOS, etc by using fully automated operations for multi-wafer, large statistics sample collections and built-in algorithms/libraries.